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FNIRSI LCR-ST1 10KHz LCR Meter Tweezer, Mini Smart SMD Tester, ESR Meter, Multimeter, Capacitance Inductance Continuity Diode Tester, Auto Component Recognition Electronic Component Analyze
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*Price and Stocks may change without prior notice
*Packaging of actual item may differ from photo shown
- Electrical items MAY be 110 volts.
- 7 Day Return Policy
- All products are genuine and original
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FNIRSI LCR-ST1 10KHz LCR Meter Tweezer, Mini Smart Features
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【LCR Tweezer Tester】The FNIRSI LCR-ST1 is a multifunctional and portable testing instrument that supports precise measurement of resistance, capacitance, inductance, and diodes
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【Measurement Range】3 test frequencies – 100 Hz, 1 kHz, 10 kHz. 2 test voltage - 0.3 Vrms, 0.6 Vrms. R: 10 mΩ to 10 MΩ / C: 1 pF to 22 mF / L:1 uH to 10 H
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【Multiple functions】D, Z, Q, R, ESR value reading. Auto recognition of elecronic components, primary and secondary parameters display. 1.14'' HD color display, is easy to operation
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【Data Storage and Export】The LCR tester can automatically save the test records. And you could connect the tester to your PC and transfer all the data to PC via EXCEL
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【2 Types of Tweezer Heads】With pointed head and hook head, it is convenient to test different types of products. It is equipped with a storage bag and can be charged via a data cable
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【Wide Application】Quickly detects defective components, perfect for SMD repairs, efficiently locates circuit board faults, and easily recovers parts from used boards
About FNIRSI LCR-ST1 10KHz LCR Meter Tweezer, Mini Smart
LCR-ST1 is our latest developed tweezer-type LCR bridge. Utilizing advanced measurement technology, it ensures high accuracy and stability. This product is a multifunctional and portable testing instrument that supports precise measurement of resistance, capacitance, inductance, and diodes. Its 1.14-inch color screen display and magnetic suction feature enhance usability. Supports three frequencies: 100Hz, 1kHz, and 10kHz. The unique tweezer-type design makes it particularly suitable for fine operations in narrow spaces, enabling quick testing of electronic components.
