X

Spectrum and Network Measurements (Electromagnetic Waves)

Product ID : 14571936


Galleon Product ID 14571936
Model
Manufacturer
Shipping Dimension Unknown Dimensions
I think this is wrong?
-
6,929

*Price and Stocks may change without prior notice
*Packaging of actual item may differ from photo shown

Pay with

About Spectrum And Network Measurements

Product Description This updated edition of the industry's classic text combines the theory, practice, and latest technology of spectrum and network measurements in electronic systems to offer a comprehensive and easy way to understand frequency domain measurements. Spectrum and Network Measurements, 2nd Edition has been completely updated to take into account the latest technology, particularly focusing on the shift from analog to digital in communication systems, plus an important new chapter on EMC measurements of radiated and conducted emissions has also been added. Using simplified block diagrams, this book offers a thorough coverage of critical concepts, such as decibels, Fourier analysis, noise effects, impedance matching, intermodulation distortion, reflection measurements, and S-Parameters. By picking up where the majority of electrical engineering programs stop, this title takes basic EE theory and translates it to the world of electronic measurements. This enables the reader to understand the basic theory of signals and systems, relate it to measured results, and apply it when creating new designs. Review 'Spectrum and Network Measurements, by Robert Witte, is destined to become a classic work on the subject. If you are a new RF or EMI engineer, or are a product designer incorporating wireless into your designs, and you're not quite sure how to use or optimally set up a spectrum or network analyzer, then this is the book for you!' -- Kenneth Wyatt 'The 2nd edition of Spectrum and Network Measurements brings Witte's classic text up to date for readers seeking to know about current measurement technologies, such as modular instruments, fast Fourier Transforms (FFTs), and how other instruments, such as oscilloscopes, fit into a measurement workbench with spectrum and network analyzers.' -- Jack Browne About the Author Robert A. Witte received a BSEE degree from Purdue University and MSEE degree from Colorado State University. He has spent his entire career in the test and measurement industry, working for Hewlett-Packard, Agilent Technologies, and Keysight Technologies. Robert has contributed to the development of spectrum analyzers, network analyzers, oscilloscopes and other instruments. He has held a number of R&D management positions and is currently the Vice President of Technology Leadership for Keysight Technologies. Robert is also the author of Electronic Test Instruments: Analog and Digital Measurements.